Nian Wang, Shih-Hung Chen, Geert Hellings, Kris Myny, Soeren Steudel, Mirko Scholz, Roman Boschke, Dimitri Linten, Guido Groeseneken. ESD characterisation of a-IGZO TFTs on Si and foil substrates. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 276-279, IEEE, 2017. [doi]
@inproceedings{WangCHMSSBLG17,
title = {ESD characterisation of a-IGZO TFTs on Si and foil substrates},
author = {Nian Wang and Shih-Hung Chen and Geert Hellings and Kris Myny and Soeren Steudel and Mirko Scholz and Roman Boschke and Dimitri Linten and Guido Groeseneken},
year = {2017},
doi = {10.1109/ESSDERC.2017.8066645},
url = {https://doi.org/10.1109/ESSDERC.2017.8066645},
researchr = {https://researchr.org/publication/WangCHMSSBLG17},
cites = {0},
citedby = {0},
pages = {276-279},
booktitle = {47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5978-2},
}