Seongmoon Wang, Srimat T. Chakradhar, Kedarnath J. Balakrishnan. Re-configurable embedded core test protocol. In Masaharu Imai, editor, Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004. pages 234-237, IEEE, 2004. [doi]
@inproceedings{WangCK04, title = {Re-configurable embedded core test protocol}, author = {Seongmoon Wang and Srimat T. Chakradhar and Kedarnath J. Balakrishnan}, year = {2004}, doi = {10.1145/1015090.1015145}, url = {http://doi.acm.org/10.1145/1015090.1015145}, tags = {protocol, testing}, researchr = {https://researchr.org/publication/WangCK04}, cites = {0}, citedby = {0}, pages = {234-237}, booktitle = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004}, editor = {Masaharu Imai}, publisher = {IEEE}, isbn = {0-7803-8175-0}, }