Ruizhe Wang, Jongmoo Choi, Gérard G. Medioni. 3D Modeling from Wide Baseline Range Scans Using Contour Coherence. In 2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014, Columbus, OH, USA, June 23-28, 2014. pages 4018-4025, IEEE, 2014. [doi]
Abstract is missing.