Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip

Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang. Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip. IEEE Trans. on CAD of Integrated Circuits and Systems, 28(8):1251-1264, 2009. [doi]

@article{WangCW09-2,
  title = {Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip},
  author = {Zhanglei Wang and Krishnendu Chakrabarty and Seongmoon Wang},
  year = {2009},
  doi = {10.1109/TCAD.2009.2021731},
  url = {http://dx.doi.org/10.1109/TCAD.2009.2021731},
  tags = {optimization, rule-based, testing},
  researchr = {https://researchr.org/publication/WangCW09-2},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {28},
  number = {8},
  pages = {1251-1264},
}