CED: CLIP-guided entropy dynamics for robust test-time adaptation in harsh visual conditions

Liwen Wang, Xingbo Dong, Yen-Lung Lai, Bin Pu, Zhao Liu, Qika Lin, Zhe Jin 0001. CED: CLIP-guided entropy dynamics for robust test-time adaptation in harsh visual conditions. Pattern Recognition, 177:113297, 2026. [doi]

Abstract

Abstract is missing.