The design-for-testability features of a general purpose microprocessor - researchr publication authors

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Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li 0001. The design-for-testability features of a general purpose microprocessor. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]

This author has not been identified. Look up 'Da Wang' in GoogleThis author has not been identified. Look up 'Xiaoxin Fan' in GoogleThis author has not been identified. Look up 'Xiang Fu' in GoogleThis author has not been identified. Look up 'Hui Liu' in GoogleThis author has not been identified. Look up 'Ke Wen' in GoogleThis author has not been identified. Look up 'Rui Li' in GoogleThis author has not been identified. Look up 'Huawei Li' in GoogleThis author has not been identified. Look up 'Yu Hu' in GoogleThis author has not been identified. Look up 'Xiaowei Li 0001' in Google

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