Zhen Wang, Maohong Fan, Suresh Muknahallipatna, Chao Lan. Inductive Multi-view Semi-Supervised Anomaly Detection via Probabilistic Modeling. In Yunjun Gao, Ralf Möller 0001, Xindong Wu 0001, Ramamohanarao Kotagiri, editors, 2019 IEEE International Conference on Big Knowledge, ICBK 2019, Beijing, China, November 10-11, 2019. pages 257-264, IEEE, 2019. [doi]
Abstract is missing.