SpecVAT: Enhanced Visual Cluster Analysis

Liang Wang, Xin Geng, James C. Bezdek, Christopher Leckie, Kotagiri Ramamohanarao. SpecVAT: Enhanced Visual Cluster Analysis. In Proceedings of the 8th IEEE International Conference on Data Mining (ICDM 2008), December 15-19, 2008, Pisa, Italy. pages 638-647, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.