An adhered-particle analysis system based on concave points

Wencheng Wang, Fengnian Guan, Lin Feng. An adhered-particle analysis system based on concave points. In Antanas Verikas, Petia Radeva, Dmitry P. Nikolaev, Jianhong Zhou, editors, Tenth International Conference on Machine Vision, ICMV 2017, Vienna, Austria, 13-15 November 2017. Volume 10696 of SPIE Proceedings, SPIE, 2017. [doi]

Abstract

Abstract is missing.