Probabilistic fault detection and the selection of measurements for analog integrated circuits

Zhihua Wang, Georges G. E. Gielen, Willy M. C. Sansen. Probabilistic fault detection and the selection of measurements for analog integrated circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 17(9):862-872, 1998. [doi]

Authors

Zhihua Wang

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Georges G. E. Gielen

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Willy M. C. Sansen

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