Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction

Wei Wang, Linyang He, Guohua Cheng, Ting Wen, Yan Tian. Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction. Multimedia Tools Appl., 83(2):6319-6334, January 2024. [doi]

Authors

Wei Wang

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Linyang He

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Guohua Cheng

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Ting Wen

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Yan Tian

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