Wei Wang, Linyang He, Guohua Cheng, Ting Wen, Yan Tian. Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction. Multimedia Tools Appl., 83(2):6319-6334, January 2024. [doi]
@article{WangHCWT24,
title = {Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction},
author = {Wei Wang and Linyang He and Guohua Cheng and Ting Wen and Yan Tian},
year = {2024},
month = {January},
doi = {10.1007/s11042-023-15299-9},
url = {https://doi.org/10.1007/s11042-023-15299-9},
researchr = {https://researchr.org/publication/WangHCWT24},
cites = {0},
citedby = {0},
journal = {Multimedia Tools Appl.},
volume = {83},
number = {2},
pages = {6319-6334},
}