Zhuwei Wang, Yanfen Hu, Xubin Chen, Xin Zhang, Dacheng Yang. Analytical Envelope Correlation and Outage Probability of Maximal-Ratio Combined Rician Fading Channels. In Proceedings of the 66th IEEE Vehicular Technology Conference, VTC Fall 2007, 30 September - 3 October 2007, Baltimore, MD, USA. pages 926-930, IEEE, 2007. [doi]
@inproceedings{WangHCZY07,
title = {Analytical Envelope Correlation and Outage Probability of Maximal-Ratio Combined Rician Fading Channels},
author = {Zhuwei Wang and Yanfen Hu and Xubin Chen and Xin Zhang and Dacheng Yang},
year = {2007},
doi = {10.1109/VETECF.2007.202},
url = {http://dx.doi.org/10.1109/VETECF.2007.202},
researchr = {https://researchr.org/publication/WangHCZY07},
cites = {0},
citedby = {0},
pages = {926-930},
booktitle = {Proceedings of the 66th IEEE Vehicular Technology Conference, VTC Fall 2007, 30 September - 3 October 2007, Baltimore, MD, USA},
publisher = {IEEE},
}