Zhuwei Wang, Yanfen Hu, Xubin Chen, Xin Zhang, Dacheng Yang. Analytical Envelope Correlation and Outage Probability of Maximal-Ratio Combined Rician Fading Channels. In Proceedings of the 66th IEEE Vehicular Technology Conference, VTC Fall 2007, 30 September - 3 October 2007, Baltimore, MD, USA. pages 926-930, IEEE, 2007. [doi]
Abstract is missing.