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A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

Guoyu Wang, Zweitze Houkes, Paul P. L. Regtien, M. J. Korsten, Guangrong Ji. A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 668-672, IEEE, 1998. [doi]

Authors

Guoyu Wang

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Zweitze Houkes

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Paul P. L. Regtien

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M. J. Korsten

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Guangrong Ji

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