A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

Guoyu Wang, Zweitze Houkes, Paul P. L. Regtien, M. J. Korsten, Guangrong Ji. A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 668-672, IEEE, 1998. [doi]

Abstract

Abstract is missing.