Yubo Wang, Hiroyuki Ishii, Jun Ohya. DisasterSynth: High-Resolution Disaster Scene Generation and Reliable Pseudo Labeling with Masked Feature Reconstruction. In Modesto Castrillón Santana, Daniel Riccio, Ana Fred, Maria De Marsico, editors, Proceedings of the 15th International Conference on Pattern Recognition Applications and Methods, ICPRAM 2026, Marbella, Spain, March 2-4, 2026. pages 90-101, SCITEPRESS, 2026. [doi]
Abstract is missing.