Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum. Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectronics Reliability, 41(11):1781-1787, 2001. [doi]
@article{WangJJR01, title = {Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits}, author = {Yu Wang and Patrick Juliano and Sopan Joshi and Elyse Rosenbaum}, year = {2001}, doi = {10.1016/S0026-2714(01)00034-8}, url = {http://dx.doi.org/10.1016/S0026-2714(01)00034-8}, researchr = {https://researchr.org/publication/WangJJR01}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {41}, number = {11}, pages = {1781-1787}, }