A new scheme for testability improvement of ECC incorporated memory - researchr publication authors

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Lei Wang, Jianhua Jiang, Yumei Zhou, Gaofeng Ren. A new scheme for testability improvement of ECC incorporated memory. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 240-243, IEEE, 2011. [doi]

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