Lei Wang, Jianhua Jiang, Yumei Zhou, Gaofeng Ren. A new scheme for testability improvement of ECC incorporated memory. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 240-243, IEEE, 2011. [doi]
@inproceedings{WangJZR11,
title = {A new scheme for testability improvement of ECC incorporated memory},
author = {Lei Wang and Jianhua Jiang and Yumei Zhou and Gaofeng Ren},
year = {2011},
doi = {10.1109/ASICON.2011.6157166},
url = {http://dx.doi.org/10.1109/ASICON.2011.6157166},
researchr = {https://researchr.org/publication/WangJZR11},
cites = {0},
citedby = {0},
pages = {240-243},
booktitle = {2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011},
publisher = {IEEE},
isbn = {978-1-61284-192-2},
}