Kuochen Wang, Sy-Yen Kuo. Fault detection and location in reconfigurable VLSI arrays. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 234-237, IEEE, 1989. [doi]
@inproceedings{WangK89, title = {Fault detection and location in reconfigurable VLSI arrays}, author = {Kuochen Wang and Sy-Yen Kuo}, year = {1989}, doi = {10.1109/ICCAD.1989.76943}, url = {http://dx.doi.org/10.1109/ICCAD.1989.76943}, researchr = {https://researchr.org/publication/WangK89}, cites = {0}, citedby = {0}, pages = {234-237}, booktitle = {1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers}, publisher = {IEEE}, isbn = {0-8186-1986-4}, }