Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir. Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1041-1050, IEEE Computer Society, 2003. [doi]
Abstract is missing.