Tensile CESL-induced strain dependence on impact ionization efficiency in nMOSFETs

Bo-Chin Wang, Ting-Kuo Kang, San Lein Wu, Shoou-Jinn Chang. Tensile CESL-induced strain dependence on impact ionization efficiency in nMOSFETs. Microelectronics Reliability, 50(5):610-613, 2010. [doi]

Abstract

Abstract is missing.