Wei-Lun Wang, Kuen-Jong Lee. Accelerated test pattern generators for mixed-mode BIST environments. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 368-373, IEEE Computer Society, 2000. [doi]
@inproceedings{WangL00:8,
title = {Accelerated test pattern generators for mixed-mode BIST environments},
author = {Wei-Lun Wang and Kuen-Jong Lee},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870368abs.htm},
tags = {testing, Meta-Environment},
researchr = {https://researchr.org/publication/WangL00%3A8},
cites = {0},
citedby = {0},
pages = {368-373},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}