Fa Wang, Xin Li. Correlated Bayesian Model Fusion: efficient performance modeling of large-scale tunable analog/RF integrated circuits. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 9, ACM, 2016. [doi]
@inproceedings{WangL16-26,
title = {Correlated Bayesian Model Fusion: efficient performance modeling of large-scale tunable analog/RF integrated circuits},
author = {Fa Wang and Xin Li},
year = {2016},
doi = {10.1145/2897937.2897999},
url = {http://doi.acm.org/10.1145/2897937.2897999},
researchr = {https://researchr.org/publication/WangL16-26},
cites = {0},
citedby = {0},
pages = {9},
booktitle = {Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016},
publisher = {ACM},
isbn = {978-1-4503-4236-0},
}