Value Peripheral Register Values for Fuzzing MCU Firmware

Chunlin Wang, Hongliang Liang. Value Peripheral Register Values for Fuzzing MCU Firmware. In 34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023. pages 718-729, IEEE, 2023. [doi]

Authors

Chunlin Wang

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Hongliang Liang

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