Chunlin Wang, Hongliang Liang. Value Peripheral Register Values for Fuzzing MCU Firmware. In 34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023. pages 718-729, IEEE, 2023. [doi]
@inproceedings{WangL23-104,
title = {Value Peripheral Register Values for Fuzzing MCU Firmware},
author = {Chunlin Wang and Hongliang Liang},
year = {2023},
doi = {10.1109/ISSRE59848.2023.00061},
url = {https://doi.org/10.1109/ISSRE59848.2023.00061},
researchr = {https://researchr.org/publication/WangL23-104},
cites = {0},
citedby = {0},
pages = {718-729},
booktitle = {34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1594-3},
}