Zheng Wang, Renlin Li, Anupam Chattopadhyay. Opportunistic redundancy for improving reliability of embedded processors. In 8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013. pages 1-6, IEEE, 2013. [doi]
@inproceedings{WangLC13-6,
title = {Opportunistic redundancy for improving reliability of embedded processors},
author = {Zheng Wang and Renlin Li and Anupam Chattopadhyay},
year = {2013},
doi = {10.1109/IDT.2013.6727090},
url = {http://dx.doi.org/10.1109/IDT.2013.6727090},
researchr = {https://researchr.org/publication/WangLC13-6},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013},
publisher = {IEEE},
}