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Opportunistic redundancy for improving reliability of embedded processors

Zheng Wang, Renlin Li, Anupam Chattopadhyay. Opportunistic redundancy for improving reliability of embedded processors. In 8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013. pages 1-6, IEEE, 2013. [doi]

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