Mixed supervision model applied to industrial defect detection with mask convolutional enhancement - researchr publication authors

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Zikang Wang, Jinzheng Lu, Mingcan Chen, Weidong Tan. Mixed supervision model applied to industrial defect detection with mask convolutional enhancement. In Xiaoming Zhao, Qingli Li, Lipo Wang, editors, 16th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2023, Taizhou, China, October 28-30, 2023. pages 1-7, IEEE, 2023. [doi]

This author has not been identified. Look up 'Zikang Wang' in GoogleThis author has not been identified. Look up 'Jinzheng Lu' in GoogleThis author has not been identified. Look up 'Mingcan Chen' in GoogleThis author has not been identified. Look up 'Weidong Tan' in Google

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