Zikang Wang, Jinzheng Lu, Mingcan Chen, Weidong Tan. Mixed supervision model applied to industrial defect detection with mask convolutional enhancement. In Xiaoming Zhao, Qingli Li, Lipo Wang, editors, 16th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2023, Taizhou, China, October 28-30, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{WangLCT23,
title = {Mixed supervision model applied to industrial defect detection with mask convolutional enhancement},
author = {Zikang Wang and Jinzheng Lu and Mingcan Chen and Weidong Tan},
year = {2023},
doi = {10.1109/CISP-BMEI60920.2023.10373375},
url = {https://doi.org/10.1109/CISP-BMEI60920.2023.10373375},
researchr = {https://researchr.org/publication/WangLCT23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {16th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2023, Taizhou, China, October 28-30, 2023},
editor = {Xiaoming Zhao and Qingli Li and Lipo Wang},
publisher = {IEEE},
isbn = {979-8-3503-3075-5},
}