Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process - researchr publication

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Yuan Wang, Guangyi Lu, Haibing Guo, Jian Cao, Song Jia, Xing Zhang. Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process. Science in China Series F: Information Sciences, 59(4), 2016. [doi]

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