Addressing Parametric Impact of Systematic Pattern Variations in Digital IC Design - researchr publication authors

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Pei-Hua Wang, Brian Lee, Gus Han, Richard Rouse, Philippe Hurat, Nishath Verghese. Addressing Parametric Impact of Systematic Pattern Variations in Digital IC Design. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 587-590, IEEE, 2007. [doi]

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