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Jian Wang, Binhong Li, Yang Huang, Kai Zhao, Fang Yu, Qiwen Zheng, Qi Guo, Liewei Xu, J. Gao, X. Cai, Y. Cui. The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectronics Reliability, 88:979-983, 2018. [doi]