Permittivity measurement of Ba::0.5::Sr::0.5::TiO::3:: ferroelectric thin films on multilayered silicon substrates

Zheyao Wang, Jianshe Liu, Litian Liu. Permittivity measurement of Ba::0.5::Sr::0.5::TiO::3:: ferroelectric thin films on multilayered silicon substrates. IEEE T. Instrumentation and Measurement, 55(1):350-356, 2006. [doi]

Abstract

Abstract is missing.