Haibin Wang, Rui Liu, X.-T. Li, Li Chen 0001, David M. Hiemstra, Valeri Kirischian. Total ionizing dose test facilities for micro-electronic circuits. In 2016 IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2016, Vancouver, BC, Canada, May 15-18, 2016. pages 1-4, IEEE, 2016. [doi]
Abstract is missing.