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Can Higher-Order Mutants Improve the Performance of Mutation-Based Fault Localization?

Haifeng Wang, Zheng Li 0002, Yong Liu, Xiang Chen 0005, Paul D. Franzon, Yuxiaoyang Cai, Luxi Fan. Can Higher-Order Mutants Improve the Performance of Mutation-Based Fault Localization?. IEEE Transactions on Reliability, 71(2):1157-1173, 2022. [doi]

Authors

Haifeng Wang

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Zheng Li 0002

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Yong Liu

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Xiang Chen 0005

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Paul D. Franzon

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Yuxiaoyang Cai

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Luxi Fan

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