Haifeng Wang, Zheng Li 0002, Yong Liu, Xiang Chen 0005, Paul D. Franzon, Yuxiaoyang Cai, Luxi Fan. Can Higher-Order Mutants Improve the Performance of Mutation-Based Fault Localization?. IEEE Transactions on Reliability, 71(2):1157-1173, 2022. [doi]
Abstract is missing.