Wei-Shen Wang, Zhe-Jia Liang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying Shiun Li. Thermal-Aware Test Frequency Optimization. In IEEE International Test Conference in Asia, ITC-Asia 2024, Changsha, China, August 18-20, 2024. pages 1-5, IEEE, 2024. [doi]
Abstract is missing.