Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters - researchr publication authors

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Yuxi Wang, Zhan Li, Hao Ma. Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters. In 24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015. pages 257-262, IEEE, 2015. [doi]

This author has not been identified. Look up 'Yuxi Wang' in GoogleThis author has not been identified. Look up 'Zhan Li' in GoogleThis author has not been identified. Look up 'Hao Ma' in Google

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