Yuxi Wang, Zhan Li, Hao Ma. Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters. In 24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015. pages 257-262, IEEE, 2015. [doi]
@inproceedings{WangLM15-9,
title = {Comparison of two diagnosis methods based on switching voltage pattern for IGBTs open-circuit faults in voltage-source inverters},
author = {Yuxi Wang and Zhan Li and Hao Ma},
year = {2015},
doi = {10.1109/ISIE.2015.7281478},
url = {https://doi.org/10.1109/ISIE.2015.7281478},
researchr = {https://researchr.org/publication/WangLM15-9},
cites = {0},
citedby = {0},
pages = {257-262},
booktitle = {24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015},
publisher = {IEEE},
}