Analysis of Leakage Power Reduction in Dual-Vth Technologies in the Presence of Large Threshold Voltage Variation

Wei-Shen Wang, Michael Liu, Michael Orshansky. Analysis of Leakage Power Reduction in Dual-Vth Technologies in the Presence of Large Threshold Voltage Variation. J. Low Power Electronics, 2(1):1-7, 2006. [doi]

Abstract

Abstract is missing.