Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models

Yanling Wang, Xiaojin Li, Jian Qing, Yan Zeng, Yanling Shi, Ao Guo, ShaoJian Hu, Shoumian Chen, Yuhang Zhao. Analytical parameter extraction for NBTI reaction diffusion and trapping/detrapping models. Microelectronics Reliability, 66:10-15, 2016. [doi]

Abstract

Abstract is missing.