Yong Wang, Jun Li, Nan Yan, Weiwei Li, Yong Li, Sanming Liu. Bug Patterns Localization Based on Topic Model for Bugs in Program Loop. In 2018 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2018, Lisbon, Portugal, July 16-20, 2018. pages 366-370, IEEE, 2018. [doi]
Abstract is missing.