deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level

Run Wang, Pei Liu, Lei Zhao, Yueqiang Cheng, Lina Wang. deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level. Journal of Systems and Software, 124:153-168, 2017. [doi]

Authors

Run Wang

This author has not been identified. Look up 'Run Wang' in Google

Pei Liu

This author has not been identified. Look up 'Pei Liu' in Google

Lei Zhao

This author has not been identified. Look up 'Lei Zhao' in Google

Yueqiang Cheng

This author has not been identified. Look up 'Yueqiang Cheng' in Google

Lina Wang

This author has not been identified. Look up 'Lina Wang' in Google