deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level

Run Wang, Pei Liu, Lei Zhao, Yueqiang Cheng, Lina Wang. deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level. Journal of Systems and Software, 124:153-168, 2017. [doi]

@article{WangLZCW17,
  title = {deExploit: Identifying misuses of input data to diagnose memory-corruption exploits at the binary level},
  author = {Run Wang and Pei Liu and Lei Zhao and Yueqiang Cheng and Lina Wang},
  year = {2017},
  doi = {10.1016/j.jss.2016.11.026},
  url = {http://dx.doi.org/10.1016/j.jss.2016.11.026},
  researchr = {https://researchr.org/publication/WangLZCW17},
  cites = {0},
  citedby = {0},
  journal = {Journal of Systems and Software},
  volume = {124},
  pages = {153-168},
}