Sensor Data Based System-Level Anomaly Prediction for Smart Manufacturing

Jianwu Wang, Chen Liu, Meiling Zhu, Pei Guo, Yapeng Hu. Sensor Data Based System-Level Anomaly Prediction for Smart Manufacturing. In 2018 IEEE International Congress on Big Data, BigData Congress 2018, San Francisco, CA, USA, July 2-7, 2018. pages 158-165, IEEE, 2018. [doi]

Abstract

Abstract is missing.