Decentralized two-sided sequential tests for A normal mean

Yan Wang, Yajun Mei. Decentralized two-sided sequential tests for A normal mean. In IEEE International Symposium on Information Theory, ISIT 2009, June 28 - July 3, 2009, Seoul, Korea, Proceedings. pages 2408-2412, IEEE, 2009. [doi]

Authors

Yan Wang

This author has not been identified. Look up 'Yan Wang' in Google

Yajun Mei

This author has not been identified. Look up 'Yajun Mei' in Google