Yan Wang, Yajun Mei. Decentralized two-sided sequential tests for A normal mean. In IEEE International Symposium on Information Theory, ISIT 2009, June 28 - July 3, 2009, Seoul, Korea, Proceedings. pages 2408-2412, IEEE, 2009. [doi]
@inproceedings{WangM09-26,
title = {Decentralized two-sided sequential tests for A normal mean},
author = {Yan Wang and Yajun Mei},
year = {2009},
doi = {10.1109/ISIT.2009.5206018},
url = {http://doi.ieeecomputersociety.org/10.1109/ISIT.2009.5206018},
researchr = {https://researchr.org/publication/WangM09-26},
cites = {0},
citedby = {0},
pages = {2408-2412},
booktitle = {IEEE International Symposium on Information Theory, ISIT 2009, June 28 - July 3, 2009, Seoul, Korea, Proceedings},
publisher = {IEEE},
isbn = {978-1-4244-4312-3},
}