Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules

Hua Wang, Miguel Miranda, Wim Dehaene, Francky Catthoor, Karen Maex. Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 914-919, IEEE Computer Society, 2005. [doi]

Abstract

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